Abstract
We report on the measurement of the highest purity of polarization of X-rays to date. The measurements are performed by combining a brilliant undulator source with an X-ray polarimeter. The polarimeter is composed of a polarizer and an analyzer, each based on four reflections at channel-cut crystals with a Bragg angle very close to 45°. Experiments were performed at three different X-ray energies, using different Bragg reflections: Si(400) at 6457.0 eV, Si(444) at 11,183.8 eV, and Si(800) at 12,914.0 eV. At 6 keV a polarization purity of 1.5 × 10 − 9 is achieved. This is an improvement by more than two orders of magnitude as compared to previously reported values. The polarization purity decreases slightly for shorter X-ray wavelengths. The sensitivity of the polarimeter is discussed with respect to a proposed experiment that aims at the detection of the birefringence of vacuum induced by super-strong laser fields.
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