Abstract
The measurement of switching losses with conventional double pulse tests, especially for modern wide bandgap power semiconductors, is invasive with respect to commutation cell inductance and limited in accuracy by the bandwidth of current and voltage probes. Therefore, calorimetric measurement methods are used to meet the high requirements for the characterization of extremely small soft-switching losses. In this work the noninvasive and fast transient calorimetric measurement method is evaluated for the extended characterization of hard-switching losses. For the first time the transition of the switching losses from short circuit to hard-switching, partial soft-switching, optimal soft-switching and reverse conduction are presented with high measurement accuracy due to variable measurement durations and thermal impedance calibration. In addition, the parasitic influence of switch node capacitance changes on the measurement accuracy is analyzed. The comparison with electrical measurements validates the measurement method and shows the relevance of calorimetric approaches as an alternative to electrical double pulse test measurements for improved loss pre-diction in modern resonant and fast-switching power converters.
Published Version
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