Determination of atomic pair correlation functions for nickel oxide films via extended energy-loss fine structure spectroscopy

Abstract

The extended energy-loss fine structure (EELFS) spectra for pure nickel samples (M 2,3 EELFS spectra), a NiO stoichiometric film (nickel M 2,3 EELFS and oxygen K EELFS spectra), and an “inhomogeneous” oxide film (Ni-O system) on the surface of nickel have been obtained. The calculations of amplitudes and intensities of electron transitions are performed for the corresponding inner levels of atoms taking into account the multipolarity of the excitation of inner atomic levels by an electron impact. The normalized oscillating components are extracted from EELFS spectra using the results of calculations. Close agreement between experimental results and theoretical data obtained for test Ni samples and NiO films indicate that the theoretical approaches applied to the description of EELFS spectra and the results of calculations are good approximations. Atomic pair correlation functions are obtained from the experimental normalized oscillating components of EELFS spectra with the use of the Tychonoff regularization technique.