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Abstract
An XRF method to determine arsenic and zinc in high-purity tin oxide in the range of 10–1,000 ppm is described. The sample is pressed as a double-layer pellet and the analysis is carried out by using Philips PW-1220 X-ray spectrometer. Limits of detection are 13 ppm (As) and 8 ppm (Zn). Accuracy is better than 10% at a level of 50ppm; standard deviations are 8 and 9 % at this level.
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