Abstract
Graphene segregated on Ni surface is analyzed using scanning Auger electron spectroscopy. Spectral analysis of the energy-filtered image of reflected electrons shows two main features, namely a zero-loss peak intensity that monotonically decreases with increasing number of graphene layers, and an intensity ratio of the π–π* transition peak to the zero-loss peak that monotonically increases with increasing number of graphene layers. These features can be used to determine the absolute number of graphene layers in a nanoscale region without the effect of channeling from crystal faces.
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