Abstract
This work reports on the detection of the valence band of buried Heusler compounds by means of hard x-ray photoemission spectroscopy. The measurements have been performed on the so-called “half” tunnel junctions that are thin films of Co2MnSi underneath MgO. Starting from the substrate, the structure of the samples is MgO(buffer)–Co2MnSi–MgO(tMgO)–AlOx with a thickness tMgO of the upper MgO layer of 2 and 20nm. The valence band x-ray photoemission spectra have been excited by hard x rays of about 6keV energy. The valence band spectra have been used to estimate the mean free path of the electrons through the MgO layer to be 17nm at kinetic energies of about 6keV. In particular, it is shown that the buried Co2MnSi films exhibit the same valence density of states as in bulk samples.
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