Abstract
Recording bits on recordable phase-change discs are studied using conductive atomic force microscopy (C-AFM) at high contrast. The grain size and boundary analysis of different phase-change recording materials can be performed at nanoscale spatial resolution. This study shows that C-AFM is not only suited to image the amorphous marks written on phase-change-based rewritable digital versatile discs (DVD) or Blu-ray discs (BD), but is also capable of revealing the appearance of bits in CuSi-based write-once BD discs.
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