Abstract

The aim of this paper is to present the gas sensing performance of In 2O 3 and Sn-doped In 2O 3 films prepared by a novel technique, i.e., Electrostatic Spray Deposition technique. The morphology and the microstructure studies reveal that the films are porous comprising grains in the nanometer range and crystallizing in the cubic structure. The present films prove to be sensitive to low H 2S concentrations (1–10 ppm) at low operating temperature (200 °C). Undoped films present a very high sensitivity to H 2S, compared with doped films, and a negligible response to NO 2 and SO 2. Sn dopant introduced in In 2O 3 causes a great sensitivity decrease in H 2S response, and, on the contrary, a slight increase in NO 2 and SO 2 response.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.