Abstract
We demonstrate that scattering scanning near-field infrared microscopy (s-SNIM) is a label free analytical method allowing hybridization detection of nanografted DNA patches on a sub-μM scale. On the basis of their distinct dielectric properties in the IR, we can distinguish between single stranded and double stranded DNA. The sensitivity of s-SNIM is found to be increased by 7 orders of magnitude compared to conventional FTIR spectroscopy due to the tip enhanced interaction with the substrate.
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