Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection.

Fu-Ming Tzu,Shih-Hsien Hsu,Jung-Shun Chen

doi:10.3390/mi12080964

Abstract

In this study, we developed a high-resolution, more accurate, non-destructive apparatus for refining the detection of electrode pixels in a thin-film-transistor liquid-crystal display (TFT-LCD). The hybrid optoelectronic apparatus simultaneously uses an array tester linked with the automatic optical inspection of panel defects. Unfortunately, due to a tiny air gap in the electro-optical inspector, the situation repeatedly causes numerous scratches and damages to the modulator; therefore, developing alternative equipment is necessary. Typically, in TFT-LCDs, there are open, short, and cross short electrical defects. The experiment utilized a multiple-line scan with the time delay integration (TDI) of a charge-coupled device (CCD) to capture a sharp image, even under low light, various speeds, or extreme conditions. In addition, we explored the experimental efficacy of detecting the electrode pixel of the samples and evaluated the effectiveness of a 7-inch opaque quartz mask. The results show that an array tester and AOI can detect a TFT-LCD electrode pixel sufficiently; therefore, we recommend adopting the hybrid apparatus in the TFT-LCD industry.

Highlights

We developed an optoelectronic apparatus, a hybrid array tester linked with automatic optical inspection (AOI), to detect short, and defects onwith
The glass is in the experiment detects the electrical defect on the electrode pixel of the the proper position and is ready to be delivered to Station 2 for the array tester, optical of the and
The investigation involved several experiments to evaluate the possibility of an optoelectronic apparatus comprised of an array tester linked with the automatic optical inspection

Summary

Introduction

Publisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affiliations. Lee et al (2020) [10] performed an active contour model (ACM) with image resampling on a thin-film transistor to measure the TFT-LCD pad pattern critical dimension at a width of 13 microns. They focused on an edge and gray level algorithm of the subpixel to detect the subpixel. We developed an optoelectronic apparatus with an array tester linked with automatic optical inspection (AOI) to detect the electrical signal on the electrode pixel of the TFT-LCD array. The developed apparatus exhibited a damage-free array tester and accurate quantitative statistics

Principles of Array Tester Linked with Automatic Optical Inspection

Architecture

Results and Discussion

Discussion

Topology of the inspector demonstrates the function:

13. Illustration

Conclusions