Abstract

The recently developed planar architecture (ITO/ZnO/PbS-TBAI/PbS-EDT/Au) has greatly improved the power conversion efficiency of colloidal quantum dot photovoltaics (QDPVs). However, the performance is still far below the theoretical expectations and trap states in the PbS-TBAI film are believed to be the major origin, characterization and understanding of the traps are highly demanded to develop strategies for continued performance improvement. Here employing impedance spectroscopy we detect trap states in the planar PbS QDPVs. We determined a trap state of about 0.34 eV below the conduction band with a density of around 3.2 × 1016 cm−3 eV−1. Temperature dependent open-circuit voltage analysis, temperature dependent diode property analysis and temperature dependent build-in potential analysis consistently denotes an below-bandgap activation energy of about 1.17–1.20 eV.

Highlights

  • The recently developed planar architecture (ITO/ZnO/PbS-TBAI/PbS-EDT/Au) has greatly improved the power conversion efficiency of colloidal quantum dot photovoltaics (QDPVs)

  • PbS colloidal quantum dots (PbS QDs) in solution are typically surrounded by long aliphatic ligands and once they form solid film, the long ligands act as barriers for charge transfer and transport between neighboring QDs5–7

  • Great efforts have been put in developing surface passivation approaches to reduce the traps, and power conversion efficiency (PCE) of PbS quantum dot photovoltaics (QDPVs) has been significantly improved[12,13,14,15]

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Summary

Introduction

The recently developed planar architecture (ITO/ZnO/PbS-TBAI/PbS-EDT/Au) has greatly improved the power conversion efficiency of colloidal quantum dot photovoltaics (QDPVs). Trap states in the PbS QDPVs has been carefully investigated to understand how they limit the device performance.

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