Abstract
Detecting cracks in semiconductor solarcells from eddy-current measurements : Proceedings of the 15th annual review of progress in quantitative nondestructive evaluation, La Jolla, California (USA), 31 Jul – 5 Aug. 1988. Vol. 8B, pp. 1281–1288. Edited by D.O. Thompson and D.E. Chimenti. Plenum Press (1989). ISBN 0-306-43209-9
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