Abstract
A new scheme of electrooptic (EO) imaging, named detached EO imaging (DEI), has been proposed and demonstrated, where the finest imaging resolution for an electric field distribution over a planar circuit, which had been conventionally given by an EO sensor touching the circuit surface, has been provided by the EO sensor detached from the surface. An electromagnetic theory for the DEI scheme has been presented and proved by improved resolutions of detached EO images generated by numerical simulations and acquired by live electrooptic imaging experiments.
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