Abstract
A new power structure integrating a freewheeling diode in the termination region of a punch-through (PT) insulated gate bipolar transistor (IGBT) is presented. The proposed solution requires virtually no silicon area penalty with respect to a standard IGBT. Static and dynamic experimental results show the correct behavior of both IGBT and freewheeling diode. Further, it is shown that the lateral diode surrounding the multicellular IGBT can support IGBT direct current with low on-state voltage drop. The operation mechanisms of the composite structure and design techniques to improve structure dynamic behavior are investigated through two-dimensional numerical device simulations.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
