Design of ICs applying built-in current testing

Abstract

Built-in Current (BIC) sensors have proven to be very useful in testing static CMOS ICs. In a number of experimental ICs BIC sensors were able to detect small abnormal I DDQ currents. This paper discusses the design of the circuit under test and Built-in Current (BIC) sensors, which provide: maximum level of defect detectability, minimum impact of BIC sensor on the performance of the circuit under test and minimum area overhead needed for BIC sensors implementation.