Design of High-Resolution Continuous-Time Delta–Sigma Data Converters With Dual Return-to-Open DACs

Abstract

We present design techniques for single-bit continuous-time delta–sigma modulators that attain high resolution (>16 bits) over a bandwidth (BW) that is more than ten times the audio range. We introduce the zapped, virtual-ground-switched dual return-to-open DAC which is immune to ISI and other transition-dependent errors. FIR feedback facilitates chopping, improves clock-jitter sensitivity and the loop filter’s linearity. We show that the compensation FIR DAC, which is typically bulky, can be implemented in an extremely power- and area-efficient manner in a single-bit modulator using a capacitive DAC and passive summation. Thanks to these techniques, the fabricated prototype achieves 103.2-/104.3-dB signal to noise and distortion ratio (SNDR)/signal to noise ratio (SNR) in a 250-kHz bandwidth while operating at 48 MS/s. Consuming 17.7 mW from a 1.8-V supply, the modulator occupies 1.1 mm 2 in a 180-nm CMOS process. The Schreier (SNDR) figure of merit (FoM) is 174.7 dB.