Abstract
The determination of the dependencies of the electrical resistivity of the thin film to temperature is of great importance both for understanding the conduction mechanism and for numerous technical applications of these films. In this work, to characterize, the electrical properties of thin films, a GM cryocooler-based automatic board temperature range electrical properties measurement system has been constructed. The system can measure multiple samples simultaneously. The cooling process was simulated using the time-discrete differencing to validate the optimized device design parameters and minimize heat losses. Furthermore, the temperature-dependent sheet resistance results were compared with the results from the physical property measurement system.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
