Abstract
An electronic system was designed to acquire tunneling current of a Scanning Tunneling Microscope. A tunneling current originates from the interaction between a conductive tip and a conductive or semiconductor sample. Lower currents than 100 nA were generated and from them, voltages were obtained in the order of 1 volt. Using this mechanism, it is possible to construct images of the atoms positions on the surface of the sample, also other properties of the materials can be studied.
Full Text
Published Version (
Free)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call