Abstract

In this paper, sinewave histogram test is considered as a method for the estimation of analog-to-digital converter (ADC) integral nonlinearities. The issues related to the design of test parameters are also discussed with respect to already published directions on this topic. Moreover, particular emphasis is dedicated to the problem of estimating standard uncertainty in accordance with international standards.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.