Abstract
The different manufacturing processes automatization and creating a modern digital document transferring system is an important problem for enhancing factory performance. This paper presents the results of developing an automated information system for manufacturing monolithic integrated circuits. Server and client solutions have been developed supported features of electronic covering documents, making automated on-wafer electrical characteristics measurement, and measurement data analysis.
Highlights
Different information processing tasks automatization takes a leading part in the manufacturing industry
For the Scientific-Research Institute of Semiconductor Devices, one of the main activity spheres is the sphere of microwave monolithic integrated circuits (MMIC) developing and manufacturing
A specialized software system has been developed that solves a stack of problems for automated on-wafer probe measurements and accounting covering documents in the MMIC fabrication process
Summary
Different information processing tasks automatization takes a leading part in the manufacturing industry. For the Scientific-Research Institute of Semiconductor Devices, one of the main activity spheres is the sphere of microwave monolithic integrated circuits (MMIC) developing and manufacturing. For the on-wafer probe measurement of MMICs, there are several software solutions [1,2]) They are not so much adapted for measurements related to developing new integrated circuits and to a greater extent purposed for well-established manufacturing. These solutions don't support integration with a custom database or electronic document share system. A specialized software system has been developed that solves a stack of problems for automated on-wafer probe measurements and accounting covering documents in the MMIC fabrication process
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