Abstract
Reconfigurable logic devices that are based on an FPGA substrate are gaining widespread acceptance. As such devices are used in many different configurations, manufacturers need to ensure that each potential configuration will not fail due to device defects. This flexibility leads to severely increased test time. We show how to use reconfigurability to speed up test and diagnosis times of individual FPGA blocks. We present a scheme to incorporate our test architecture, reducing diagnostic and test times of individual FPGA blocks. The test architecture includes added Feedback Shift Registers (FSRs) that change the circuit configuration during test. Algorithms are presented to produce test and diagnosis test sets with a minimized number of test configurations, along with the creation of an FSR that produces the test and diagnosis sets by dynamic reconfiguration of the device.
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