Abstract
An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, non-contact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture.
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