Abstract

Hardware redundancy is a well-known fault tolerance technique used in safety- and mission-critical systems. However, the hardening efficiency of such techniques relies on the robustness of the majority voter circuitry. This summary provides the design exploration of majority voter architectures to be used in radiation environments such as in space missions. An application-specific Single-Event Transient (SET) characterization based on the signal probability is proposed to optimize the Triple-Modular Redundancy (TMR) block insertion methodologies. Results show that the SET cross-section of complex-gate architectures presents low input dependence while for the NOR/NAND based architectures a higher dependence is observed due to the logical masking effects. Additionally, different from the other architectures, the NAND voter has shown a reduction in the SET rate as the signal probability is increased. Considering the signal probability p = 0.1, p = 0.5 and p = 0.9, the best design for the two analyzed orbits is the NOR, CMOS1 and NAND voter, respectively.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.