Design and Reliability in Wafer Level Packaging

Abstract

Wafer Level Packaging (WLP) has the highest potential for future single chip packages because the WLP is intrinsically a chip size package. The package is completed directly on the wafer then singulated by dicing for the assembly. All packaging and testing operations of the dice are replaced by whole wafer fabrication and wafer level testing. Therefore, it becomes more cost-effective with decreasing die size or increasing wafer size. However, due to the intrinsic mismatch of the coefficient of thermal expansion (CTE) between silicon chip and plastic PCB material, solder ball reliability subject to temperature cycling becomes the weakest point of the technology. In this paper some fundamental principles in designing WLP structure to achieve the robust reliability are demonstrated through a comprehensive study of a variety of WLP technologies. The first principle is the 'structural flexibility' principle. The more flexible a WLP structure is, the less the stresses that are applied on the solder balls will be. Ball on polymer WLP, Cu post WLP, polymer core solder balls are such examples to achieve better flexibility of overall WLP structure. The second principle is the 'local enhancement' at the interface region of solder balls where fatigue failures occur. Polymer collar WLP, and increasing solder opening size are examples to reduce the local stress level. In this paper, the reliability improvements are discussed through various existing and tested WLP technologies at silicon level and ball level, respectively. The fan-out wafer level packaging is introduced, which is expected to extend the standard WLP to the next stage with unlimited potential applications in future.