Abstract
Laser soft damage of electro-optical (EO) sensors can be defined as the destruction of electronic primary devices, or the photo detectors. This damaging effect causes system’s functions to be lost. In this paper dazzling and soft damage of electro-optical sensors, including, complementary metal oxide semiconductors (CMOS) imaging sensors and charge-coupled devices (CCD) imaging sensors were studied both theoretically and experimentally. A MATLAB simulation model was built and used for predicting the design parameters of practical laser system. This laser system is capable of damaging EO sensors from laboratory scale to far field distances; this was achieved by maximizing the laser pulse energy. In addition, we designed and implemented an enhanced high energy flash lamp pumped pulsed Nd:YAG laser system with 2 J energy to achieve soft damaging of numerous types of EO sensors at different distances. Good agreement between the theoretical and experimental results obtained and a CCD image sensor was successfully soft damaged at a distance of 4 Km in free space environments.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
