Abstract
The prevalent surface profile measurement techniques in the sub-millimetre measurement scale, based on active triangulation (such as laser scanners), stereo vision and photometric stereo, may miss certain parts of the surface of the object due to occlusion. Occlusion occurs in these techniques as they rely on a top-view configuration, where the illumination rays and the surface profile lie on the same plane. In this study, a surface profile measurement device is designed and developed, which can generate occlusion-free measurements by adopting a side-view configuration. This proposed measurement technique is tested on a few surfaces, and the results are presented.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
