Design and Development of A Modified AXI Based BIST Technique for Memory Architectures

Abstract

Listen

Translate article

Memory testing and fault detection is an important phase in testing the hardware devices. This improves the overall performance of the system and prevents runtime failures in the devices. Built In Self Test (BIST) is a hardware memory test architecture deployed in many System on Chip devices to enable fault detection. This technique reduces the cost and time needed to test the memory systems. Different BIST modules need to be used to detect faults in different memories. As a result, design complexity increases. In order to overcome these above shortcomings, it is essential to develop advanced extensible Interface (AXI) with Block Random Access Memory (BRAM) and Design and Develop AXI based self-test memory architecture (March Algorithms) to achieve parallel read and write capability. The proposed model reduced the dynamic power and the clock cycles needed for simulation when compared to existing techniques.