Design and Analysis of Complementary Metal–Oxide–Semiconductor Single-Pole Double-Throw Switches for 28 GHz 5G New Radio

Abstract

We propose a single-pole double-throw (SPDT) switch with low insertion loss (IL), high isolation, and high linearity for a 28 GHz 5G new radio. The transmit (TX) path is a π-network consisting of a parallel dynamic-threshold metal–oxide–semiconductor (DTMOS) transistor, M1, with large body-floating resistance, RB (DTMOS-R M1), a series one-eighth-wavelength (λ/8) transmission line (TL), and a parallel capacitance, Cant. The series λ/8-TL in conjunction with the parallel Cant and transistors’ capacitance constitute an equivalent λ/4-TL with a characteristic impedance of 50 Ω. This leads to low IL in the TX mode and decent isolation in the receive (RX) mode. The RX path is an L-network constituting a series impedance (of parallel inductance L1 and DTMOS-R M2) and a parallel DTMOS-R M3. This leads to a decent IL in the RX mode and isolation in the TX mode. The first SPDT switch (SPDT SW1) is designed and implemented in a 90 nm complementary metal–oxide–semiconductor (CMOS) with a top metal thickness (TMT) of 3.4 μm. A comparative SPDT switch (SPDT SW2) in a 0.18 μm CMOS with a thinner TMT of 2.34 μm is also designed and implemented. In the TX mode, SPDT SW1 achieves a measured IL of 0.67 dB at 28 GHz and 0.58–1 dB for 17–34.9 GHz and a measured isolation of 44.3 dB at 28 GHz and 25.6–62.3 dB for 17–34.9 GHz, one of the best IL and isolation results ever reported for millimeter-wave CMOS SPDT switches. The measured input 1 dB compression point (P1dB) is 28.5 dBm at 28 GHz. Moreover, in the RX mode, SPDT SW1 attains a measured IL of 1.9 dB at 28 GHz and 1.83–2.1 dB for 25–38.3 GHz and an isolation of 25 dB at 28 GHz and 24.5–27 dB for 25–38.3 GHz. The measured P1dB is 24 dBm at 28 GHz.