Abstract
This paper presents an in-depth analysis of an SiGe BiCMOS on-off keying (OOK) receiver composed of a low-noise SiGe amplifier and an OOK detector. The analysis indicates that the bias circuit and bias current have a substantial impact on the receiver and should be optimized for best performance. The LO leakage from the transmitter can also have a detrimental impact on the receiver sensitivity and should be minimized for best performance. The receiver consumes 11 mW, has a noise equivalent power of 5-10 fW/Hz <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1/2</sup> at 55 GHz, and an instantaneous dynamic range of 27-30 dB. The OOK receiver achieves 6-Gb/s communication with a bit-error rate (BER) <; 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-12</sup> at room temperature. Operation is also demonstrated up to 105°C at 3 Gb/s with a BER <; 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-12</sup> .
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