Depth-Resolved Residual Stress Analysis with High-Energy Synchrotron X-Rays Using a Conical Slit Cell

Abstract

A conical slit cell for depth-resolved diffraction of high-energy X-rays was used for residual stress analysis at the high-energy materials science synchrotron beamline HEMS at PETRA III. With a conical slit width of 20 µm and beam cross-sections of 50 µm, a spatial resolution in beam direction of 0.8 mm was achieved. The setup was used for residual stress analysis in a drawn steel wire with 8.3 mm diameter. The residual stress results were in very good agreement with results of a FE simulation.