The application of white radiation to residual stress analysis in the intermediate zone between surface and volume

Abstract

Mechanical surface processing is known to give rise to complex residual stress fields in the near surface region of polycrystalline materials. Consequently, their analysis by means of non-destructive X-ray and neutron diffraction methods has become an important topic in materials science. However, there remains a gap with respect to the accessible near surface zone, which concerns a range between about 10 μm and 1 mm, where the conventional X-ray methods are no longer and the neutron methods are not yet sensitive. In order to achieve the necessary penetration depth τ to perform residual stress analysis (RSA) in this region, advantageous use can be made of energy dispersive X-ray diffraction of synchrotron radiation (15–60 keV) in the reflection mode. Besides an example concerning the adaptation of methods applied so far in the angle dispersive RSA to the energy dispersive case, the concept of a new materials science beamline at BESSY II for residual stress and texture analysis is presented.