Abstract
To study the initial defect formation and accumulation process during fission events, sliced pellet specimens of UO 2 and (U,Gd)O 2 were irradiated at ambient temperatures below 200°C, with 100 MeV iodine ions over a fluence range of 1.0 × 10 18 − 2.0 × 10 19 ions/m 2. The surface of the specimens was analyzed by scanning electron microscopy (SEM) and X-ray diffractometry (XRD), and then the depth profiles of incident iodine ions and defect clusters were measured by secondary ion mass spectrometry (SIMS) and transmission electron microscopy (TEM), respectively. Lattice parameter change, which is associated with point defect accumulation, increased with ion fluence. Defect clusters of dislocations and dislocation loops were recognized, and their depth profiles were in good agreement with the calculated damage profile. These profiles of iodine ions and dislocation loops in both UO 2 and (U,Gd)O 2 were discussed in terms of inelastic and elastic collisions.
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