Abstract
Depth from defocus using structured light is a useful optical metrology technique since the camera and projector can be placed on the same optical axis and it can cope with depth discontinuities. However, the technique can suffer from large errors when used on surfaces with differing reflective properties. This paper demonstrates a method for overcoming this problem.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
