Abstract
Lateral variations of the exciton confinement energy Ecx have been investigated in a GaAs-AlGaAs multiple quantum well (MQW) structure using cathodoluminescence (CL) imaging in a scanning electron microscope. The MQW structure was grown by molecular beam epitaxy on a 2° misoriented GaAs substrate. The CL image of a defined MQW region does not change its lateral intensity distribution after removing different numbers of quantum wells by etching, indicating a correlated variation of Ecx between different quantum wells on a length scale of several μm. The variation of Ecx is connected to a mound like surface topography.
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