Depletion of Reflectance of Silicon Surface Textured Using Nano Second Fiber Laser

Abstract

This paper characterizes the surface modification on silicon surfaces with different patterns (circle, pyramid) using a nanosecond fiber laser with different parameters, which enhances its anti-reflection property. The influence of textured and untextured silicon surfaces and their structural properties were evaluated. It has a long absorption path (200–1000 nm) and a rougher surface due to surface modifications, which results in a 40% decrease in incident light reflectance, especially in pyramid-shaped dimples with 70 µm size, helping to trap more light in solar cells where the anti-reflecting surface is a crucial need for devices used in optical and photovoltaic applications to operate more effectively. Scanning electron microscope (SEM) and atomic force microscopy (AFM) are used to examine the surface features to determine the process’s effectiveness and recognize the development of patterns that are deep enough to trap light. XRD and micro-Raman spectroscopy were used to examine the irradiated surface’s crystallographic structure and crystallinity change.