Abstract
The effect of preionization induced by depleted uranium (U23892) around the insulator sleeve on the x-ray emission of (2.3–3.9kJ) plasma focus device is investigated by employing Quantrad Si p-i-n diodes and a multipinhole camera. X-ray emission in 4π geometry is measured as a function of charging voltage with and without preionization. It is found that the preionization enhances CuKα and total x-ray yield about 100%, broadens the x-ray emission pressure range and x-ray pulse width, and improves shot to shot reproducibility of plasma focus operation. The pinhole images of x-ray emitting zones indicate that dominant x-ray emission is from the anode tip.
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