Abstract

Cu2ZnSnS4 (CZTS) thin films were fabricated using a rapid thermal process in 5% H2S+ N2 atmosphere from precursors prepared by the sol–gel method. The precursors were preheated at 250 °C for 10 min and then sulfurized at different temperatures from 300 to 600 °C for 10 min. XRD studies showed that the samples sulfurized at 500–600 °C had a CZTS structure. With increasing sulfurization temperature, the chemical composition ratio of sulfur/metal and the grains size of CZTS increased. From the (αh ν)2–hν plot, the CZTS films had a band gap of ∼1.5 eV.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.