Abstract
The transversal magneto-optic Kerr effect in thin cobalt films and Co/Cu/Co structures obtained by magnetron sputtering in the magnetic field is investigated. It is shown that the dependences of the TMOKE and reflection intensity on the incidence angle of light substantially vary upon varying the thickness of the cobalt layer from 6 to 0.7 nm. The theoretical evaluation of the obtained data in the context of the classic theory of propagation of light in the conducting medium is presented
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
