Abstract
An ellipsometric configuration for measurement of complex transverse magneto-optical Kerr effect is described that uses photoelastic modulator (PEM). The real and imaginary parts of the complex transverse Kerr effect are represented as small perturbations of ellipsometric angles $\psi$ and $\Delta$. The measurement based on null ellipsometry and zone averaging gives high signal typical for modulation techniques and insensitivity to other magnetisation components and system imperfections. The method is demonstrated by the measurement of transverse component during magnetisation reversal in thin cobalt film.
Highlights
Magneto-optical (MO) methods have been established as commonly used nondestructive techniques for study of thin-film and surface magnetism
Magneto-optic vector magnetometry is widely used for monitoring of magnetisation reversal and magnetic anisotropy
Phase modulation techniques with a photoelastic modulator (PEM) were applied for transverse Kerr effect measurement by several authors [10, 18, 19]
Summary
Magneto-optical (MO) methods have been established as commonly used nondestructive techniques for study of thin-film and surface magnetism. At transverse magnetization the optical access even for angles of incidence close to the grazing incidence can be accomplished with minimum restrictions on the shape of electromagnet pole pieces In this way, higher in-plane magnetic fields can be applied to the sample. The method of rotation of the magnetic field and a sample [2] to separate magnetisation components is problematic for some special and in-situ measurements In such cases, two in-plane magnetisation components can be measured by the longitudinal and transverse MO effects and separated only by change of optical configuration. Phase modulation techniques with a PEM were applied for transverse Kerr effect measurement by several authors [10, 18, 19]. Shows an example of the modelled angular dependence of the complex transverse Kerr effect for cobalt thin film
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