Abstract
The dependence of the transport and magnetization critical current density (Jc) characteristics on the superconducting layer thickness (d) was investigated for IBAD/CVD-processed, YBCO-coated conductors. It is believed that the decrease in Jc with increasing d in the low magnetic-field region is caused by degradation of the superconducting layer structure. The irreversibility field (Bi) increased in the low electric-field region as the thickness increased, whereas it decreased in the usual electric-field region. The apparent pinning potential (U0*) estimated using magnetic relaxation measurement also showed a complicated dependence on thickness. The results observed were approximately explained by the prediction of the flux creep-flow model.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: TEION KOGAKU (Journal of the Cryogenic Society of Japan)
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
