Abstract
Current-induced magnetization switching in an MgO-based magnetic tunnel junction (MTJ) was experimentally studied. Probabilistic distribution of a switching current was measured at various current pulse widths from 5μsto100ms. A thermal stability parameter Δ of a free-layer magnetic moment and an intrinsic switching current density Jc0 of the MTJ were evaluated from the switching current distribution using a thermal activation model. The estimated Δ and Jc0 were approximately independent of the pulse width and were in good agreement with the values estimated from the pulse-width dependence of the switching current density, demonstrating the validity of the thermal activation model.
Published Version
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