Abstract
An X-ray absorption method for measuring the density of vertically aligned carbon nanotube film grown on a flat substrate is proposed. X-rays can penetrate the film parallel to the surface direction, and the transmitted X-rays are detected by an X-ray camera, which enables the film, substrate, and air regions to be distinguished in the observed X-ray image. When the sample surface is aligned just parallel to the penetrating direction of the X-rays, the transmittance of the film can be observed. The film density is calculated from the observed transmittance if the elemental composition of the film material is known.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
