Abstract
An X-ray absorption method for measuring the density of vertically aligned carbon nanotube film grown on a flat substrate is proposed. X-rays can penetrate the film parallel to the surface direction, and the transmitted X-rays are detected by an X-ray camera, which enables the film, substrate, and air regions to be distinguished in the observed X-ray image. When the sample surface is aligned just parallel to the penetrating direction of the X-rays, the transmittance of the film can be observed. The film density is calculated from the observed transmittance if the elemental composition of the film material is known.
Full Text
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call