Abstract
The use of semiconductor detectors in delayed coincidence measurements of shor nuclear half-lives is considered. Their use is illustated by an accurate measurement of the half-life of the 86.5 keV excited state in 233Pa. A result of (37.7±0.2) ns was obtained. The result of a measurement of the half-life of the 59.6 keV level in 237Np is also reported. The value obtained was (68.5±0.4) ns. Both these results are in good agreement with previous recent determinations.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
