Delay testable logical circuit design

Abstract

Specific physical defects of high performance circuits manifest themselves as path delay faults (PDFs). A pair (v1, v2) of test patterns is required to detect a PDF. A PDF is robust testable if there is a test pair on which the fault manifestation does not depend on delays of other circuit paths. A PDF is non robust testable if manifestation of the fault on any test pair is possible only when all other paths of the circuit are fault free. For high quality delay testing it is desirable to detect delay of any path regardless of delays of other paths. In this paper, synthesis of a circuit by covering each nonterminal node of the reduced ordered binary decision diagram (ROBDD) or free binary decision diagram (Free BDD) system with the original subcircuit from gates is suggested. Delay testability of such circuits is investigated. It is specified that the PDF of each path of the circuit is detected without injecting additional inputs into the circuit. It is well known that the BDD is a directed acyclic graph based on the Shannon decomposition in each nonterminal node v: 0 1 i i x x v i v i v f x f x f = = = ∨ . Here fv is the function corresponding to the node v, and the decomposition variable xi marks the node v. The dashed edge drops in the node corresponding to the function 0 i x v f = , and the bold edge drops in the node corresponding to the function 1 i x v f = . The BDD is called ordered (OBDD) if variables are encountered in the same order in all paths connecting the BDD root with the terminal node. The BDD is called reduced (RBDD) if it does not contain either isomorphic subgraphs or nonterminal nodes such that 0 1 i i x x v v f f = = = . An example of reduced and ordered BDD (ROBDD) is shown in Fig. 1. When deriving the Free BDD, a suitable decomposition variable is chosen for each nonterminal node v independently of other nonterminal nodes. That may cut the number of Free BDD of nonterminal nodes in comparison with the ROBDD (for the same function). Let 1 { ,..., } m F f f = be a system of Boolean functions describing combinational circuit behavior. Derive the ROBDD using the same order of variables for each Boolean function from F. Join isomorphic subgraphs in different ROBDDs. Combine different ROBDDs of 1-terminal nodes into one 1-terminal node and their 0-terminal nodes into one 0-terminal node. As a result, we obtain the graph with m roots and two terminal nodes. This graph represents a system of m Boolean functions. It is called the shared ROBDD. Without loss of generality, we will further consider systems with one function as an example. In Fig. 1, the ROBDD for one Boolean function is shown. The ROBDD represents the disjoint sum of products (DSoP) of the function f as follows: