Abstract
Patterned Ni anodes on Y2O3-stabilized ZrO2 (YSZ) represent a promising approach to determine the kinetics of electrochemical reactions in SOFC. Contrary to technical Ni/YSZ cermet anodes, the reaction zone for the hydrogen oxidation has the potential to be well defined. In this study the focus was on the structural stability of the Ni patterned anodes and its correlation with activation and degradation processes. Considerable activation and degradation processes with time constants in the order of some hours were found and are discussed: (i) an initial decrease in LSR during the first 20 - 25 h of temperature exposure, attributed to a restructuring process in the Ni thin film (ii) reversible changes in LSR upon pH2O / pH2 variations in correlation to the initial gas composition (iii) rapid reversible changes in LSR upon anodic and cathodic polarization followed by a slow relaxation.
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