Abstract
AbstractThe deformation effects for free excitons in CdS were studied by measuring the excitation spectra of the edge emission at 77 K for uniaxial stress parallel or perpendicular to the c‐axis. The stress‐induced shift of the A and B exciton peaks is in good agreement with the corresponding results of previous piezoreflection and piezoemission experiments. Moreover, the C exciton shift could be measured which enables a more precise determination of the deformation potential constants. For the first time a piezospectroscopy of excited states of free excitons could be carried out showing the exciton binding energy to be stress‐independent. The observed stress dependence of the excitation probability ratios for various excitons can be attributed to the stress‐controlled thermal exciton dissociation.
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