Abstract
Abstract Defects on a {011} surface of a single crystal of Mo were imaged at between 3 and 16 eV using low-energy electron microscopy. Linear slip traces predominantly along the , , and directions appeared after quenching the crystal from 2000 K. Crystallographic slip was typically only of one atomic step distance. The slip traces were modified by the migration of the atomic steps, producing complex defect structures. Screw dislocations marking a twist boundary were also observed. The capabilities of low-energy electron microscopy for imaging defects on surfaces of one atomic step height are demonstrated.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
