Abstract
In this chapter, noncontact AFM (nc-AFM) work concerning defects on the native MgO(001) surface is reviewed. Due to their relevance Electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) are first introduced. Experimental spectroscopy curves and images are then discussed and compared with results from theory, with the focus on atomic resolution and defect identification.
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