Abstract
A modified method of optical defectoscopy of ZnGeP2 single crystal plates using a strontium vapour laser (λ = 1.03 and 1.09 μm) is proposed based on shadow imaging of internal defects in plates cut parallel to the (100) plane. It is shown that the use of a strontium vapour laser with a wavelength of 6.45 mm makes it possible to study inhomogeneities in large-size ZnGeP2 samples. The possibility of fabricating a projection defectoscope for monitoring breakdown development in ZnGeP2 crystals is considered.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
