Abstract
Transmission electron microscopy has been applied to the defect structure of titanium nitride in the submicrocrystalline (SMC) state produced under conditions of deviation from equilibrium in ion-plasma synthesis. The submicrocrystals contain a new type of defect substructure having a continuum disclination density up to 2.5 rad/µm2. Direct structure methods give evidence for a high density of partial disclinations at the SMC grain boundaries in the nitride phase. A novel method has been used to examine substructures having a high defect density, which has been used to estimate the partial disclination density at the submicrocrystal boundaries. The origin of this highly defective state and the effects of it on the properties of SMC materials is discussed.
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